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Precision Products Marketing Pvt.Ltd

No. 4C, A2 First Floor, 70 Feet Road,
Jawahar Nagar, Chennai - 600 082, India

Kosaka Surface Roughness & Contour

DSF800

DSF800 is a digital contour and roughness measuring instrument to achieve wide dynamic range measurements with high accuracy.

  1. Various parameters of surface roughness or waviness and various contour are analyzable.

PRODUCT DIMENSIONS

Z resolution / measuring range 0.00075 µm / ±6 mm (0.0015 µm / ±12 mm)
Z detection method Semiconductor laser scale
Stylus R2 µm / 0.75 mN / 60° R25 µm / 10 mN / 25°
Analysis item Contour (element, scalar, statistics, master comparison, tolerance judge) Roughness (JIS, ISO, DIN, ANSI, BS) Waviness (JIS)
We would introduce roundness and cylindricity measuring instruments to evaluate such roundness, straightness, cylindricity and coaxiality  

 

DSF500

By 1 scanning, contour and roughness or waviness are able to be gained

  1. High resolution and wide dynamic range
  2. Suitable for complex-shape precision components

PRODUCT DIMENSIONS

Z resolution / measuring range 0.0075 µm / 5 mm 0.012 µm / 8 mm
Stylus R2 µm / 0.75 mN / 60 ° R25 µm / 10 mN / 25°
Analysis item Contour (element, scalar, statistics, tolerance judge) Roughness (JIS, ISO, DIN, ANSI, BS) Waviness (JIS)

 

SEF3500

SEF3500K,SEF3500DK

  1. SEF3500K is a reasonable combination unit with 2D and 3D roughness and form contour measuring instrument.

2D roughness measurement

  1. Compatible with various parameters
  2. Automatically performing measurement through printing
  3. Free layout of data chart

3D roughness measurement

  1. Parallel processing of data collection and analysis
  2. Recording bird’s-eye view or a differential contour
  3. Max. 100 million sampling points with high resolution

Contour measurement

  1. Fully satisfied software function is supplied, such auto ball screw analysis, stylus radius correction, and so on.
  2. Free layout of data chart

 

PRODUCT DIMENSIONS

2D roughness  
Standards JIS(2001/94/82), DIN, ISO, ASME
Measuring range    Z: 600 µm X: 100 mm
Measuring magnification    Z: 50-500,000 X: 1-5,000
Recording Recordable in free layout
Stylus R2 µm, 0.7 mN
3D roughness  
Measuring range    Z: 600 µm X: 100 mm Y: 50 mm
Minimum sampling pitch 1 µm for X and Y
Recording Color recording (bird’s eye view, differential contour, etc.),
Stylus R2 µm 0.7 mN
Form contour  
Analysis item Element / scalar / ball screw, etc
Measuring range    Z: 50 mm X: 100 mm
Stylus    Z:  600 µm X: 100 mm Y: 50 mm
We would introduce hybrid contour and roughness measuring instruments able to detect roughness and waviness buried in contour profile.  

 

SE 600K31

SE 600K31 3D Surface Roughness Measuring Function is added to SE 3500 to enable deep evaluation of a target Surface with respect to a line and a plane.

2D Roughness

  1. Compatible with various Parameters Automatic Calibration of Z and X axis Auto-Printing Performace.

3D Roughness

  1. Paraellel Processing of analysis and Measurement Recording bird's-eye view or a differential contour Max.100 million sampling ponints with high resolution

 

PRODUCT DIMENSIONS

2D Roughness

Standards JIS(2001/94/82), DIN, ISO, ASME,
Measuring range    Z:  600 µm X: 100 mm
Measuring magnification    Z:  50-500,000 X: 1-5,000
Recording Recordable in free layout

3D Roughness

Measuring Range    Z: 600 µm X: 100 mm Y: 50mm
Minimum sampling pitch 1 µm for X and Y
Recording Color recording (bird's eye view, different contour, etc.), particle analysis, 3D roughness parameter analysis, etc

 

SE 600

SE 600 is complied to worldwide standards including ISO, JIS, DIN, ASME and BS, and each old and current standards. Various filters, cutoff values, measuring length and formula types are provided to meet the standards.

  1. Complied to worldwide standards
  2. Free layout of data chart
  3. Provided automatic calibration of Z and X axis
  4. Enabling a series of measurement in arbitrary combination with various automated measurement elements
  5. The refined design

PRODUCT DIMENSIONS

Standards JIS(2001/94/82), DIN, ISO, ASME, etc
Measuring range    Z: 600 µm X: 100 mm
Measuring magnification    Z: 50-500,000 X: 1-5,000
Measuring mag speed 0.05-2 mm/s
Z traverse range 250 mm
Recording Free layout

 

SE 500

SE 500 is so Phisticated, compact design and high performance model for Surface Roughness, Waviness and Steps.Compatible with various Parameters and perform simultaneous analysis of multiple Standards. Excellent expandable unit to meet all applications.

  1. Longest driving range and straightness in portable class
  2. Combining a touch panel with a switch operation
  3. Larger margin of recording paper
  4. Enabling combinations compatible with various applications

PRODUCT DIMENSIONS

Standards JIS(2001/94/82), DIN, ISO, ASME
Measuring range    Z:  800 µm X: 55 mm
Measuring resolution 0.08 nm
Measuring magnification    Z: 50 to 200,000 or Auto X: 1 to 1,000 or Auto
Measuring speed    0.05-2 mm/s  
 Combinations 7 Models from portable type to stationary type

 

SE 300

SE 300 is a portable high-performance surface roughness and waviness measuring instrument, characterized by skidless measurement, built-in high resolute printer, memory for 5 measurement conditions, Cross over the 2 Standards analysis function

  1. Wide range
  2. Portable type corresponding to skidless Measurement and step heigh analysis & printing with high resolution printer
  3. High performance pick-up with interchangeable stylus
  4. Compatible with worldwide Standards
  5. Automatic calibration in both X and Z directions

PRODUCT DIMENSIONS

Parameters 63 parameters such Ra, Ry and Rz
Measurement range / resolution Z: 800 µm / 0.0064 µm
Max. measured length X: 25 mm
Measuring magnification Z: 100 to 100,000 or Auto X: 1 to 1,000
Pick-up Interchangeable Stylus Standard Stylus: R2 µm, 60
Power supply AC Adaptor

 

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